Analysis apparatus and electronic device

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 9389179
APP PUB NO 20150233822A1
SERIAL NO

14623114

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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An analysis apparatus includes an electric field enhancing element including a metallic layer, a transmissive layer on the metallic layer and transmitting excitation light, and metallic particles on the transmissive layer with first and second pitches in first and second directions; a light source irradiating the element with first direction linearly polarized light, second direction linearly polarized light, and/or circularly polarized light as the excitation light; and a detector detecting light from the element. The pitches are selected relative to the pitch of a diffraction grating. The thickness of the transmissive layer is selected relative to the wavelength of the excitation light.

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Patent Owner(s)

  • SEIKO EPSON CORPORATION

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Enari, Megumi Suwa, JP 19 40
Sugimoto, Mamoru Chino, JP 67 489

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