Low temperature thin wafer backside vacuum process with backgrinding tape
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United States of America Patent
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Jul 12, 2016
Grant Date -
Nov 7, 2013
app pub date -
Sep 29, 2011
filing date -
Sep 29, 2011
priority date (Note) -
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Abstract
Vacuum processing, such as a backside metallization (BSM) deposition, is performed on a taped wafer after a gas escape path is formed between a base film of the tape and the wafer frontside surface following backgrind. Venting provided by the gas escape path reduces formation of bubbles under the tape. The gas escape path may be provided, for example, by a selective pre-curing of tape adhesive, to breach an edge seal and place the wafer frontside surface internal to the edge seal in fluid communication with an environment external to the edge seal. With the thinned wafer supported by the pre-cured tape, BSM is then deposited while the wafer and tape are cooled, for example, via a cooled electrostatic chuck.
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