Hardware-embedded key based on random variations of a stress-hardened inegrated circuit
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United States of America Patent
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Jul 12, 2016
Grant Date -
Sep 18, 2014
app pub date -
May 8, 2013
filing date -
Mar 15, 2013
priority date (Note) -
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Abstract
An IC cell designed to assert one of multiple possible output states, each with equal probability, implemented to assert a pre-determined one of the multiple output states based on random variations within the IC cell, such as random process variations. An array of IC cells is configurable to provide a hardware-embedded key upon power-up that is unique to the combination of random variations of selected IC cells, resistant to tampering prior to and during manufacture, and tolerant to aging, instantaneous thermal noise, and environmental variations, such as voltage and temperature fluctuations. The key may be used as, without limitation, a Platform Root Key, a High-Bandwidth Digital Content Protection (HDCP) key, an Enhanced Privacy Identification (EPID) key, and/or an Advanced Access Content System (AACS) key. Also disclosed are techniques to measure stability and stress-harden an IC cell based on output states of the IC cell.
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