Assembly inspection method and associated device
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United States of America Patent
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Aug 30, 2016
Grant Date -
Jun 26, 2014
app pub date -
Dec 20, 2013
filing date -
Dec 20, 2012
priority date (Note) -
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Abstract
A method for inspecting the quality of an alignment between the elements of an assembly, and an associated device, the method of which comprises tasks consisting of measuring a first parameter with a first measuring means, said first parameter being selected from a movement parameter of at least one part of the double-access fastening means, an assembly force parameter or a torque, measuring a second parameter with a second measuring means, said second parameter being selected from the same parameters and being different from the first parameter, calculating a value of a first derivative of a function representing a change in the second parameter relative to the first parameter by suitable information processing means, and analyzing the value of the first derivative to check the alignment between the elements to be assembled.
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