Real-time multi-point diffraction-based imaging system for strain measurement
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United States of America Patent
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Sep 13, 2016
Grant Date -
Oct 1, 2015
app pub date -
Mar 27, 2015
filing date -
Mar 27, 2014
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Abstract
This invention relates to a system and a method for measuring strain of a specimen on a strain measurement system having an image capturing device, a spatial light modulator, a first light source, a second light source and a beam switching controller. The system receives parameters from an input from a user and generates a lenslet pattern to be transmitted to the spatial light modulator. The system transmits a frequency and switching sequence to the beam switching controller to alternate the first and second light sources and activate the image capturing device to capture images. The system receives a first image captured by the image capturing device caused by a beam of the first light source and a second image captured by the image capturing device caused by a beam of the second light source. Based on the first and second images received, the system optimizes the image capturing device.
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