Manufacturing control apparatus and manufacturing control system
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United States of America Patent
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Sep 13, 2016
Grant Date -
Dec 19, 2013
app pub date -
Mar 15, 2013
filing date -
Jun 13, 2012
priority date (Note) -
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Abstract
A manufacturing control apparatus of an electronic device is configured to implement processing to generate a first model function relating to a relationship between a characteristic of a component included in the electronic device. The apparatus is configured to implement processing to determine a first manufacturing condition value to obtain the characteristic of the component based on the first model function. The apparatus is configured to implement processing to calculate a squared prediction error of a measured value of the characteristic of the component. The apparatus is configured to implement processing to determine a second manufacturing condition value of the next electronic device according to the calculated squared prediction error.
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