Inspection apparatus and method using pattern recognition
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United States of America Patent
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Sep 20, 2016
Grant Date -
Jul 26, 2012
app pub date -
Jul 5, 2010
filing date -
Jul 16, 2009
priority date (Note) -
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Abstract
Inspection apparatus comprises a feed system for delivering a stream of articles to an imaging zone. A camera generates image data from the stream at the imaging zone for processing by a computer. The computer comprises a pattern recognition system for identifying defects in areas from the image data, and for ranking identified defects. The pattern recognition system is programmed to operate according to multiple defect criteria. The computer is also coupled to a graphical user interface to display the areas identified from the image data as thumbnails on the interface arranged according to rank of the identified defects in the areas, in each of at least two defect criteria. The areas from the generated image data will normally be defined around each identified defect with the defect central therein. These areas, or thumbnails, can overlap.
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