Closed-loop testing of integrated circuit card payment terminals

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United States of America Patent

PATENT NO 9449320
SERIAL NO

14732921

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Abstract

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Technologies for closed-looped testing of integrated circuit card payment terminals include loading a test profile onto an integrated circuit payment card. Authorization request and response messages are locally generated and translated to simulate acquirer processor processing and payment network processing. An outcome report indicative of the outcome of the test transaction is generated and transmitted to a remote certification server. Other embodiments are described and claimed.

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Patent Owner(s)

Patent OwnerAddress
WORLDPAY LLC8500 GOVERNORS HILL DRIVE SYMMES TOWNSHIP OH 45249

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Cole, Steven Scott West Chester, US 5 32
Walters, Patricia Lynn Phoenix, US 11 53

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