Methods and apparatus for calibrating for transconductance or gain over process or condition variations in differential circuits
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United States of America Patent
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Sep 20, 2016
Grant Date -
Jul 14, 2016
app pub date -
Jan 12, 2015
filing date -
Jan 12, 2015
priority date (Note) -
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Abstract
An apparatus is provided. The apparatus includes a calibration circuit configured to generate a reference signal and at least one differential circuit each being configured to operate at a calibrated transconductance over process or condition variations based on the reference signal. The calibration circuit may be configured to generate the reference signal independent of the at least one differential circuit. A method for operating at least one differential circuit is provided. The method includes generating a reference signal and operating the at least one differential circuit at a calibrated transconductance or gain over process or condition variations based on the reference signal. The reference signal may be generated independently of the at least one differential circuit.
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