Microtomic system and process utilizing electrostatic force to handle sample sections

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United States of America Patent

PATENT NO 9464967
APP PUB NO 20150338316A1
SERIAL NO

14284328

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Abstract

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Provided is a microtomic system and process for the preparation of sections for microscope examination. A cutting edge in the system can cut through a sample block and produce a section one end of which remains attached to the cutting edge. A voltage generator can generate a voltage and apply the voltage between the cutting edge and a section receiver such as a semiconductor chip grid. Through electrostatic force caused by the voltage, another end of the section can anchor to the section receiver. The section is then spread on the receiver. The system is automatable, highly efficient, and does not need liquid to float sample sections, and can therefore maintain the integration of the sample sections.

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Patent Owner(s)

Patent OwnerAddress
FOCUS E-BEAM TECHNOLOGY (BEIJING) CO LTD8 YONGCHANG NORTH RD BDA NO 8 YONGCHANG TECHNOLOGY PARK SUITE 8101 BEIJING 100176

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chen, Zhongwei San Jose, US 131 1026

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