Transistors with source and word line voltage adjusting circuitry for controlling leakage currents and its method thereof

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United States of America Patent

PATENT NO 9466342
APP PUB NO 20160071579A1
SERIAL NO

14593395

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Abstract

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According to one embodiment, a semiconductor memory device includes a source voltage adjustment circuit and a word line voltage adjustment circuit, which are configured to respectively supply a source voltage supply end and a word line switchingly with voltage-adjusted voltages, in response to a mode switching signal for switching between a retention state mode and an active state mode, wherein the source voltage supply end is connected to sources of MOS transistors forming a flip-flop of a memory cell, and the word line is connected to gates of access transistors.

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Patent Owner(s)

  • TOSHIBA MEMORY CORPORATION

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Miyano, Shinji Yokohama Kanagawa, JP 50 991

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