System and process for high-density, low-energy plasma enhanced vapor phase epitaxy
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United States of America Patent
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Oct 11, 2016
Grant Date -
Oct 3, 2013
app pub date -
Mar 11, 2013
filing date -
Feb 28, 2005
priority date (Note) -
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Abstract
A process for epitaxial deposition of compound semiconductor layers includes several steps. In a first step, a substrate is removably attached to a substrate holder that may be heated. In a second step, the substrate is heated to a temperature suitable for epitaxial deposition. In a third step, substances are vaporized into vapor particles, such substances including at least one of a list of substances, comprising elemental metals, metal alloys and dopants. In a fourth step, the vapor particles are discharged to the deposition chamber. In a fifth step, a pressure is maintained in the range of 10^−3 to 1 mbar in the deposition chamber by supplying a mixture of gases comprising at least one gas, wherein vapor particles and gas particles propagate diffusively. In a sixth optional step, a magnetic field may be applied to the deposition chamber. In a seventh step, the vapor particles and gas particles are activated by a plasma in direct contact with the sample holder. In an eighth step, vapor particles and gas particles are allowed to react, so as to form a uniform epitaxial layer on the heated substrate by low-energy plasma-enhanced vapor phase epitaxy.

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Patent Owner(s)
Patent Owner | Address | |
---|---|---|
OERLIKON METCO AG WOHLEN | 5610 WOHLEN |
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- [Patents Count]
Inventor(s)
Inventor Name | Address | # of filed Patents | Total Citations |
---|---|---|---|
Von, Känel Hans | Wallisellen, CH | 11 | 40 |
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