Apparatus, system and method for dynamically measuring material viscoelasticity using shear wave induced resonance
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United States of America Patent
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Nov 15, 2016
Grant Date -
Jul 11, 2013
app pub date -
Sep 26, 2011
filing date -
Sep 26, 2010
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Abstract
A system for dynamically measuring viscoelasticity of material samples using shear wave induced resonance, the system comprising: i) an apparatus comprising a vibration source; a vibration detector; a processor, and a user interface, for example to select a sample holder configuration, and ii) a rigid sample holder connectable to the vibration source, wherein the vibration source generates shear waves that induce vibrations and the resonance of a sample through the holder, the vibration sensor measuring the sample vibrations and resonance, and the processor determining the viscoelasticity of the sample from the vibrations or resonances and from the selected sample holder configuration. Multiple measurement modalities using the system to study materials viscoelasticity as function of time parameters; temperature parameters; strain parameters; repetition parameters and mapping parameters.
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