Diffraction imaging

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United States of America Patent

PATENT NO 9506880
SERIAL NO

14311659

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Abstract

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A method of imaging phases in an inhomogeneous polycrystalline sample having a plurality of crystallites of at least a first crystalline component includes illuminating an illuminated area extending across a surface of a sample with substantially monochromatic X-rays incident at a Bragg-Brentano parafocussing geometry at first angle θ1 to the surface of the sample. X-rays diffracted by the sample at a second angle θ2 pass through a pinhole. The diffraction angle θ1+θ2 fulfils a Bragg condition for the first crystalline component which is imaged by a detector to provide a two-dimensional image of the first crystalline component at the surface of the sample.

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Patent Owner(s)

Patent OwnerAddress
MALVERN PANALYTICAL B V7602 EA ALMELO

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Beckers, Detlef Almelo, NL 18 49
Gateshki, Milen Almelo, NL 13 35

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