Check after write for assessing wear related degradation in solid state storage

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United States of America Patent

PATENT NO 9514845
SERIAL NO

14534638

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Abstract

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A group of one or more solid state storage cells is programmed. A predetermined amount of time after the group of solid state storage cells is programmed, the group of solid state storage cells is read to obtain read data. Error correction decoding is performed on the read data and the group of solid state storage cells is assessed for wear related degradation based at least in part on the error correction decoding.

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Patent Owner(s)

  • SK HYNIX INC.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Bellorado, Jason San Jose, US 120 736
Subramanian, Arunkumar San Jose, US 32 404
Wu, Zheng San Jose, US 138 913

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