Intensity correction for TOF data acquisition
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United States of America Patent
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Dec 6, 2016
Grant Date -
Jun 30, 2016
app pub date -
Aug 7, 2014
filing date -
Aug 9, 2013
priority date (Note) -
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Abstract
Systems and methods are provided for correcting uniform detector saturation. In one method, a mass analyzer analyzes N extractions of an ion beam. A nonzero amplitude from an ADC detector subsystem is counted as one ion, producing a count of one for each ion of each sub-spectrum. The ADC amplitudes and counts of the N sub-spectra are summed, producing a spectrum that includes a summed ADC amplitude and a total count for each ion of the spectrum. A probability that the total count arises from single ions hitting the detector is calculated. For each ion of the spectrum where the probability exceeds a threshold value, an amplitude response is calculated, producing amplitude responses for ions found to be single ions hitting the detector. Amplitude responses are combined, producing a combined amplitude response. The total count is dynamically corrected using the combined amplitude response and the summed ADC amplitude.
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