Testing device

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United States of America Patent

PATENT NO 9535114
SERIAL NO

14092534

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Abstract

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A testing device comprises a first probe member, a second probe member, and an insulation member. The first probe member comprises a tip portion for contacting a device being tested. The second probe member also comprises a tip portion for contacting the device being tested. The insulation member is located at or can be moved to a location between the tip portions of the first and second probe members.

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Patent Owner(s)

Patent OwnerAddress
STAR TECHNOLOGIES INC2F NO 101 SEC 2 GONGDAO 5TH RD EAST DIST HSINCHU CITY 30070

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chen, Ho Yeh Hsinchu, TW 16 24
Lou, Choon Leong Singapore, SG 84 115
Tseng, Hsiao Ting Hsinchu, TW 5 19

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