Systems and methods for frequency domain calibration and characterization
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United States of America Patent
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Jan 3, 2017
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app pub date -
Sep 17, 2015
filing date -
Dec 30, 2013
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Abstract
A system for assigning a characterization and calibrating a parameter is disclosed. The system includes a frequency measurement circuit and a finite state machine. The frequency measurement circuit is configured to measure frequencies of an oscillatory signal and to generate a measurement signal including measured frequencies. The finite state machine is configured to control measurements by the frequency measurement circuit, to assign a characterization to a parameter based on the measurement signal, and to generate a calibration signal based on the characterized parameter.
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