Spatially self-similar patterned illumination for depth imaging

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United States of America Patent

PATENT NO 9562760
SERIAL NO

14643966

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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Methods, systems, and devices involving patterned radiation are provided in accordance with various embodiments. Some embodiments include a device for projecting pattern radiation. Some embodiments include a method for estimating coordinates of a location on an object in a 3D scene. Some embodiments include a system for estimating the coordinates of a location on an object in a 3D scene. A variety of radiation patterns are provided in accordance with various embodiments. Some embodiments may relate to the use of patterned illumination to identify the angular information that may be utilized to measure depth by triangulation.

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Patent Owner(s)

  • COGNEX CORPORATION

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Braker, Benjamin Louisville, US 18 464
McDonald, Trevor Boulder, US 5 74
Moore, Eric Boulder, US 41 796
Wegner, Aaron Longmont, US 24 286
Zimmerman, Ronald Boulder, US 9 82

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