Pixel circuit, display device, and inspection method
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United States of America Patent
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-
Feb 14, 2017
Grant Date -
Aug 28, 2014
app pub date -
May 13, 2014
filing date -
Nov 10, 2009
priority date (Note) -
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status (Latency Note)
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Abstract
Checking failures in transistors including driving transistors, switching transistors, and sampling transistors before light emitting elements are formed in a display device. I-V characteristics including threshold voltage of the driving transistor 10C in one pixel circuit can be detected. In a pixel circuit, the sampling transistor 10A and switching transistor 10D are made conductive and the signal potential is given to the gate electrode of the driving transistor 10C from the signal line DTCm. At this time, the current which flows between the drain electrode and source electrode of driving transistor 10C flows through the switching transistor 10D and a reference potential line Vref_r to a test point, and is measured by a current measuring device connected to the test point.
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