Non-contact method and system for inspecting a manufactured part at an inspection station having a measurement axis
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United States of America Patent
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Feb 21, 2017
Issued Date -
N/A
app pub date -
Feb 24, 2015
filing date -
May 17, 2011
priority date (Note) -
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Abstract
A method and system for inspecting a manufactured part at an inspection station are provided. A supported part is rotated about a measurement axis so that the part moves at predetermined angular increments during at least one rotational scan. A backside beam of collimated radiation is directed at and is occluded by the supported part at each of a first plurality of consecutive increments of movement to create a stream of unobstructed portions of the backside beam in rapid succession passing by and not blocked by the supported part. A frontside beam of radiation is directed at and is reflected by the supported part at each of a second plurality of consecutive increments of movement to create a stream of reflected portions of the frontside beam in rapid succession. The streams of reflected and unobstructed portions are detected at the inspection station to obtain electrical signals which are processed.
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