Electrically conductive pins for load boards lacking Kelvin capability for microcircuit testing
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United States of America Patent
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Mar 28, 2017
Grant Date -
N/A
app pub date -
Jul 11, 2014
filing date -
Apr 21, 2011
priority date (Note) -
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status (Latency Note)
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Abstract
A device under test (DUT) has terminals connected to electrically conductive contacts which are in turn connect to a load board and to a test signal source. A second set of kelvin terminals are likewise connected to the DUT, but by pass the load board for connection to a test signal source. The kelvin terminals extend distally away from the DUT and are bonded to a flex circuit at their distal ends so that they make electrical and mechanical contact with the flex circuit. An intermediary terminal block receives the flex circuit and a ribbon cable or other wire connects to a test signal source. The entire circuit then circumvents the use of the load board.
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