X-ray tomographic inspection system for the identification of specific target items
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United States of America Patent
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Mar 28, 2017
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app pub date -
Sep 8, 2015
filing date -
Apr 25, 2003
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Abstract
The present invention provides for an improved scanning process with a stationary X-ray source arranged to generate X-rays from a plurality of X-ray source positions around a scanning region, a first set of detectors arranged to detect X-rays transmitted through the scanning region, and at least one processor arranged to process outputs from the first set of detectors to generate tomographic image data. The X-ray screening system is used in combination with other screening technologies, such as NQR-based screening, X-ray diffraction based screening, X-ray back-scatter based screening, or Trace Detection based screening.
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