X-ray analysis apparatus

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United States of America Patent

PATENT NO 9618461
APP PUB NO 20140105368A1
SERIAL NO

14050676

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Abstract

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An X-ray analysis apparatus for detecting, using an X-ray detector, X-rays given off by a sample when the sample is irradiated with X-rays, the X-ray analysis apparatus having replaceable components. The X-ray analysis apparatus comprises labels attached to the replaceable components and including symbols indicating the types of replaceable components, a camera for photographing the replaceable components and the labels, and CPU and image recognition software for specifying the types of replaceable components by calculation based on the symbols in the labels.

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Patent Owner(s)

Patent OwnerAddress
RIGAKU CORPORATIONAKISHIMA-SHI TOKYO 196-8666

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Nishi, Kunio Hachioji, JP 6 53
Ohara, Takao Ome, JP 8 33
Ozawa, Tetsuya Hino, JP 41 274
Wakasaya, Kenji Akishima, JP 3 10

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