On-center electrically conductive pins for integrated testing
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United States of America Patent
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May 2, 2017
Issued Date -
N/A
app pub date -
Jul 10, 2014
filing date -
Mar 15, 2013
priority date (Note) -
In Force
status (Latency Note)
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Abstract
A structure and method for providing a contact pin between a device under test (DUT) and a load board which provides upper and lower contact point which are axial aligned is disclosed. The pin has an upper (30) and lower (32) section and a hinge in between which allow flex of both upper and lower contact (24/26) which, but the axial alignment can provide a direct replacement for POGO pins but with greater reliability. It also includes a structure and method for removing upper pins 230 by use of a modified hinge 244a. In an alternate embodiment, the lower section includes a leg extension 320 and a sliding contact land 360 which slides against an aperture in the housing. A spacer 342 provides space for decoupling components on the load board. The hinge may include a truncated cylinder 40b which is configured to permit remove of the upper pin without removal of the lower.
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