X-ray apparatus

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United States of America Patent

PATENT NO 9640292
SERIAL NO

14547976

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Abstract

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X-ray diffraction apparatus includes a flat graded multilayer 8 which may be used in a SAXS configuration for a sample 6. The apparatus may be adapted for Bragg-Brentano measurements by a collimator 16 without the need for alternate beam paths or complex arrangements.

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Patent Owner(s)

Patent OwnerAddress
MALVERN PANALYTICAL B V7602 EA ALMELO

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Beckers, Detlef Almelo, NL 18 49
Prugovecki, Stjepan Almelo, NL 1 0

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