Cumulant microscopy
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United States of America Patent
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May 23, 2017
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app pub date -
Mar 31, 2012
filing date -
Jun 14, 2011
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Abstract
The invention describes a method and a microscopy system for imaging and analyzing stochastically and independently blinking point-like emitters. A multiple-order cumulants analysis in conjunction with an established blinking model enables the extraction of super-resolved environment-related parameter maps, such as molecular state lifetimes, concentration and brightness distributions of the emitter. In addition, such parameter maps can be used to compensate for the non-linear brightness and blinking response of higher-order cumulant images—used for example in Super-resolution Optical Fluctuation Imaging (SOFI)—to generate a balanced image contrast. Structures that otherwise would be masked by brighter regions in the conventional cumulant image become samples using spectral cross-cumulants.
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