Particle characterization
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United States of America Patent
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Jun 13, 2017
Issued Date -
N/A
app pub date -
Dec 3, 2015
filing date -
May 1, 2015
priority date (Note) -
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Abstract
A particle characterization apparatus having first and second body parts, a light source, a sample cell and a detector. The light source illuminates dispersed particles within the sample cell with a light beam along an axis to produce scattered light. The sample cell has first and second walls. The walls have internal surfaces arranged to be in contact with the sample and an opposite external surface. The light beam passes through the external surface of the first wall, through the internal surface of the first wall, through the sample, through the internal surface of the second wall, and through the external surface of the second wall. The light source is fixed to the first body part, which engages with the first wall. The detector is fixed to the second body part, which engages with the second wall. The first and second body parts are separable to enable access to the internal surfaces of the walls for cleaning.
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