Route examining system and method
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United States of America Patent
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Jun 20, 2017
Issued Date -
N/A
app pub date -
Apr 6, 2015
filing date -
Nov 21, 2012
priority date (Note) -
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Abstract
A system includes first and second application devices, a control unit, and at least one processor. The first and second application devices are configured to be at least one of conductively or inductively coupled with one of the conductive tracks. The control unit is configured to control the first and second application devices in order to electrically inject a first examination signal into the conductive tracks via the first application device and a second examination signal into the conductive tracks via the second application device. The at least one processor is configured to monitor one or more electrical characteristics of the first and second conductive tracks in response to the first and second examination signals being injected into the conductive tracks; and to identify a type of fault based upon the one or more electrical characteristics of the first and second conductive tracks.
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