Compact spectrometer for two-dimensional sampling
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United States of America Patent
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Jun 20, 2017
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N/A
app pub date -
Mar 17, 2009
filing date -
Mar 31, 2008
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Abstract
A spectrometer for sampling interferograms in two dimensions offering a large spectral band and high spectral resolution with a relative compactness. The spectrometer includes a refracting surface, an array of detecting elements and an array of diffusion elements capturing means at the refracting surface of an interferogram delivered from two interference beams (F1, F2) and forming interference lines parallel to each other along the transverse axis (Ox) of the interferogram within the plane (xOy) of the refracting surface, the array of detection elements being parallel to the plane of the refracting surface and arranged to detect the spatial distribution of the interferogram, wherein the array is a two-dimensional array over an entirety of which the detections elements are disposed equidistantly, and wherein interference lines exhibit an angular shift with the capturing means.
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