Method of authenticating a polymer film by thickness measurement with a white light interferometer

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United States of America Patent

PATENT NO 9739597
SERIAL NO

12937515

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Abstract

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A method of authenticating a polymer film comprises measuring the thickness of a layer therein by white light interferometry and/or measuring the birefringence of a layer therein. The method, and devices to carry out the method, may be used in security applications, for example to test for counterfeit bank notes.

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Patent Owner(s)

Patent OwnerAddress
INNOVIA FILMS LIMITEDWIGTON CUMBRIA CA7 9BG

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Stewart, Robert Laird Wigton, GB 12 25

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