Method, system and apparatus for measuring comparatively thick materials

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United States of America Patent

PATENT NO 9766190
SERIAL NO

14496966

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Abstract

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A method, system and apparatus are provided to measure magnetic characteristics of a comparatively thick magnetic sample in a magnetic field or nonmagnetic field by X-ray magnetic circular dichroism (XMCD). In particular, the method, system and apparatus measure the magnetic characteristics of the thick magnetic sample by irradiating the sample with X-ray, and detecting transmissive X-ray passing through the sample.

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Patent Owner(s)

Patent OwnerAddress
TOYOTA JIDOSHA KABUSHIKI KAISHA1 TOYOTA-CHO TOYOTA-SHI AICHI-KEN 471-8571
INTER-UNIVERSITY RESEARCH INSTITUTE CORPORATION HIGH ENERGY ACCELERATOR RESEARCH ORGANIZATION1-1 OHO TSUKUBA-SHI IBARAKI 305-0801

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Ono, Kanta Tsukuba, JP 5 13
Yano, Masao Sunto-gun, JP 48 239

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