Systems and methods for imaging characteristics of a sample and for identifying regions of damage in the sample

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United States of America Patent

PATENT NO 9778202
SERIAL NO

13878944

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Abstract

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Systems and methods for imaging characteristics of a sample and for identifying regions of damage in the sample are generally described. Some example systems and methods for non-destructive evaluation of regions of material may operate in a direct current (DC) mode in which the system directly images regions of material where weak structural damage has occurred by imaging a self magnetic field generated by a DC electric current coupled through the material. Some example systems may operate in an alternating current (AC) mode to image regions of material where damage has occurred by generating a time varying magnetic field due to AC excitation coils inducing eddy currents in the sample, and imaging a magnetic field generated by the eddy currents around the regions of damage. The systems may use magneto-optical imaging techniques (MOI) to measure and map the magnetic field and channels of current flow in the material, for example.

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Patent Owner(s)

Patent OwnerAddress
INDIAN INSTITUTE OF TECHNOLOGY KANPURDEAN RESEARCH & DEVELOPMENT ROOM NUMBER 151 FACULTY BUILDING POST OFFICE IIT KANPUR KANPUR UTTAR PRADESH 208016

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Banerjee, Satyajit Kanpur, IN 10 117
Mohan, Shyam Kanpur, IN 1 9
Sinha, Jaivardhan Kanpur, IN 2 24

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