Management system for skin condition measurement analysis information and management method for skin condition measurement analysis information
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United States of America Patent
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Oct 3, 2017
Issued Date -
N/A
app pub date -
Feb 15, 2013
filing date -
Feb 15, 2012
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Abstract
Service can be offered free of charge and the cost of a skin condition measuring device can be reduced by effectively using data on the occasion of obtaining an analysis result by transmitting measurement data by the skin condition measuring device to a server of a company providing a service of analyzing the measurement data. When a request is made from a contractor client to acquire data registered in a measurement data database, authentication is executed based on a contractor ID input from the contractor client. Additionally, when the measurement data database is searched from a contractor database based on the contractor ID, a search level and an access level are obtained. The contractor client is permitted to search the measurement data database within a range of the search level and the access level.
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