Apparatus for preparing a sample for microscopy

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United States of America Patent

PATENT NO 9779914
SERIAL NO

14341284

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Abstract

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An apparatus for preparing a sample for microscopy is provided that has a milling device that removes material from a sample in order to thin the sample. An electron beam that is directed onto the sample is present along with a detector that detects when the electron beam has reached a preselected threshold transmitted through or immediately adjacent the sample. Once the detector detects the electron beam has reached this threshold, the milling device terminates the milling process.

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Patent Owner(s)

  • E.A. FISCHIONE INSTRUMENTS, INC.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Boccabella, Michael F North Huntington, US 3 50
Fischione, Paul E Export, US 14 330

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