Probe and method of manufacturing probe

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United States of America Patent

PATENT NO 9784764
SERIAL NO

14452592

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ATTORNEY / AGENT: (SPONSORED)

Importance

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Abstract

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A probe for connecting an electrode terminal of an electric circuit or an electric component includes a first spring; a second spring covering the first spring; a cover covering the second spring; a first terminal that is connected to the second spring and is provided at one end of the probe; and a second terminal that is connected to the cover and is provided at another end of the probe.

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Patent Owner(s)

  • FUJITSU COMPONENT LIMITED

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kobayashi, Mitsuru Tokyo, JP 178 2762
Sato, Koki Tokyo, JP 123 845
Tanaka, Tetsugaku Tokyo, JP 17 95

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