Laser apparatus

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United States of America Patent

PATENT NO 9793684
APP PUB NO 20170098921A1
SERIAL NO

15379735

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A laser apparatus includes first and second gain media; first, second, and third wavelength selection filters; and first and second mirrors. The wavelengths of first and second laser light emitted from end surfaces of the first and second gain media, respectively, are different from each other. The third wavelength selection filter is a wavelength selection filter to select light having wavelengths that cyclically exist in the light, as light to be selected. The other end surfaces of the first and second gain media are connected with the first input/output ports of the first and second wavelength selection filters, respectively. The fourth input/output ports of the first and second gain media are connected with the first and second mirrors, respectively. The first and second input/output ports of the third wavelength selection filter are connected with the second input/output ports of the first and second wavelength selection filters, respectively.

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Patent Owner(s)

Patent OwnerAddressTotal Patents
FUJITSU LIMITEDKAWASAKI18047

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Patent Info (Count) # Cites Year
 
Other [Check patent profile for assignment information] (1)
* 2004/0022,280 Integrated laser oscillator-amplifier system 1 2003
 
NEC CORPORATION (2)
2006/0198,416 Wavelength tunable laser 18 2006
2010/0284,649 VARIABLE WAVELENGTH LIGHT SOURCE, OPTICAL MODULE AND MANUFACTURING METHOD OF VARIABLE WAVELENGTH LIGHT SOURCE 6 2009
 
SUMITOMO ELECTRIC DEVICE INNOVATIONS, INC. (1)
2010/0034,224 TUNABLE LASER MODULE, TUNABLE LASER APPARATUS AND CONTROLLING METHOD FOR TUNABLE LASER 6 2009
 
SUMITOMO ELECTRIC INDUSTRIES, LTD. (1)
2011/0235,659 SEMICONDUCTOR LASER 7 2011
 
JDS UNIPHASE CORPORATION (1)
* 6665320 Wideband tunable laser sources with multiple gain elements 17 2001
 
ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE (1)
2009/0135,857 FREQUENCY-TUNABLE TERAHERTZ LIGHT SOURCE DEVICE 2 2008
* Cited By Examiner

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