Method for measuring the thickness of a layer of material, galvanizing method and related measuring device
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United States of America Patent
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Oct 24, 2017
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Jun 3, 2014
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Jul 1, 2013
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Abstract
Method of measuring the thickness of a layer by a light source irradiating the layer with a light beam, which light source is controlled by a sinusoidal control signal having a modulation frequency fm so that the light beam presents optical power that is sinusoidally modulated at the modulation frequency, the measurement method consisting in:
- using detector elements to determine a calibration phase shift (Δφcal) between the optical power and the control signal;heating the layer with the light beam;using the detector elements to detect a sinusoidal component of a heat flux radiated by the layer;calculating a phase shift (Δφth/opt) between the sinusoidal component of the radiated heat flux and the optical power of the light beam while taking account of the calibration phase shift; anddetermining the thickness of the layer of material as a function of the phase shift (Δφth/opt).
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