System for applying phantom sample to evaluate optical analysis device, storage device storing instructions, method and phantom sample

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United States of America Patent

PATENT NO 9797839
APP PUB NO 20150355092A1
SERIAL NO

14738134

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Abstract

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An optical system of an optical analysis device is easily evaluated with high accuracy.

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Patent Owner(s)

  • OLYMPUS CORPORATION

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Yamaguchi, Mitsushiro Tokyo, JP 18 148

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