Device testing and monitoring method thereof

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United States of America Patent

PATENT NO 9804220
SERIAL NO

14714635

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Abstract

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Some embodiments of the present disclosure provide a method including turning on a noise-measuring system for a device under test (DUT) with the DUT turned off; measuring a first phase noise caused by the noise-measuring system; turning on the DUT; measuring a second phase noise caused by the noise-measuring system and the DUT; and subtracting the first phase noise from the second phase noise to obtain a third phase noise caused by the DUT.

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Patent Owner(s)

  • TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chien, Jinn-Yeh Hsinchu, TW 20 97
Horng, Jaw-Juinn Hsinchu, TW 129 431
Liu, Szu-Lin Hsinchu, TW 49 113

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