Device for monitoring environmental states of a microscope sample with an electron microscope sample holder

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United States of America Patent

PATENT NO 9818578
SERIAL NO

14626234

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Abstract

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An apparatus and a method for measuring and monitoring the properties of a fluid, for example, pressure, temperature, and chemical properties, within a sample holder for an electron microscope. The apparatus includes at least one fiber optic sensor used for measuring temperature and/or pressure and/or pH positioned in proximity of the sample.

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Patent Owner(s)

Patent OwnerAddress
PROTOCHIPS INC3800 GATEWAY CENTRE BLVD SUITE 306 MORRISVILLE NC 27560

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Carpenter, William Bradford Asheville, US 17 55
Damiano,, Jr John Apex, US 56 443
Gardiner, Daniel Stephen Wake Forest, US 32 97
Nackashi, David P Raleigh, US 49 487
Walden,, II Franklin Stampley Raleigh, US 36 122

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