Common calibration system and corresponding method
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United States of America Patent
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Nov 21, 2017
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app pub date -
Dec 21, 2012
filing date -
Dec 29, 2011
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Abstract
The invention relates to a system (1) comprising a deformable surface (2) and a first and a second sensor (C1, C2) designed to provide a first and a second measurement signal (S1, S2) intended to be collected by a processing circuit (12), said system (1) comprising first and second measurement paths (V1, V2) for collecting the first and second measurement signals (S1, S2), said system (1) being characterized in that it comprises a common calibration member (20) for simultaneously injecting into the first and second measurement paths (V1, V2) a calibration signal (SE), said common calibration member (20) being designed so that the image signals (S′1, S′2, S′n) restored via said measurement paths (V1, V2, Vn) are independent of said movable surface (2). Deformable movable surface systems, of the deformable mirror type.
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