Apparatus and method to adjust power and performance of integrated circuits
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United States of America Patent
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Nov 21, 2017
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N/A
app pub date -
Jun 13, 2011
filing date -
May 29, 2008
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Abstract
The voltage applied to an integrated circuit is scaled so as to account for variations in the manufacturing processes, temperature, and the like, and to allow for power/performance optimization of the integrated circuit. The integrated circuit may characterized during a manufacturing test or anytime thereafter. The characterization data, which reflects the performance and power consumption of the integrated circuit, is used to determine an associated processing/speed bin, which in turn, defines the voltage that will be applied to the integrated circuit during normal operation. Optionally, a number of different supply voltages are applied to different circuit blocks disposed in the same integrated circuit. Each such circuit block may have a different characterization data associated with a different supply voltage.
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