Magnetic measurement system and apparatus utilizing X-ray to measure comparatively thick magnetic materials

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United States of America Patent

PATENT NO 9835569
SERIAL NO

15471412

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Abstract

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A magnetic measurement system includes an X-ray source, a monochromator that converts right- and left-polarization X-ray into right- and left-monochromatic X-ray, an aperture slit that allows the right- and left-monochromatic X-ray to pass through, an analytical section, and piezoelectric scanning devices. The analytical section has a Fresnel zone plate that receives and focuses the right- and left-monochromatic X-ray on a single point being 10 nm or less wide of a magnetic sample, an order-sorting aperture that allows the focused X-ray to selectively pass through, a sample-stage that sets a comparatively thick magnetic sample that is more than 150 nm thick and less than or equal to 1000 nm thick to be irradiated with the X-ray, and an X-ray-detector that detects transmittance of transmission X-ray passing through the comparatively thick sample and that generates X-ray magnetic circular dichroism (XMCD) data by directly measuring the detected transmittance of the transmission X-ray.

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Patent Owner(s)

Patent OwnerAddress
INTER-UNIVERSITY RESEARCH INSTITUTE CORPORATION HIGH ENERGY ACCELERATOR RESEARCH ORGANIZATION1-1 OHO TSUKUBA-SHI IBARAKI 305-0801

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Ono, Kanta Tsukuba, JP 5 13
Yano, Masao Sunto-gun, JP 48 239

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