Systems and methods for using interleaving window widths in tandem mass spectrometry
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United States of America Patent
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Dec 12, 2017
Grant Date -
Dec 29, 2016
app pub date -
Sep 8, 2016
filing date -
May 18, 2012
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Abstract
Systems and methods are provided for analyzing a sample using overlapping measured mass selection window widths. A mass range of a sample is divided into two or more target mass selection window widths using a processor. The two or more target widths can have the same width or variable widths. A tandem mass spectrometer is instructed to perform two or more fragmentation scans across the mass range using the processor. Each fragmentation scan of the two or more fragmentation scans includes a measured mass selection window width. The two or more measured widths of the two or more fragmentation scans can have the same width or variable widths. At least two of the two or more measured mass selection window widths overlap. The overlap in measured mass selection window widths corresponds to at least one target mass selection window width.
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