High di/dt capacity measurement hardware

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United States of America Patent

PATENT NO 9846182
SERIAL NO

14291085

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Abstract

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Hardware test systems are provided that have an electrical test loop with a minimum length of less than 200 mm, a maximum di/dt capacity of at least 1500 A/μs and a minimum parasitic inductance of less than 100 nH. The hardware tests systems can be used for commutation measurement or other test applications requiring low stray inductance.

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Patent Owner(s)

  • INFINEON TECHNOLOGIES AG

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Meng, Pon Tiam Melaka, MY 1 1
Siew, Tai Chee Melaka, MY 1 1

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