X-ray backscattering safety inspection system having a distributed-type X-ray source and method using the same
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United States of America Patent
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Dec 19, 2017
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app pub date -
Jul 6, 2015
filing date -
Jul 4, 2014
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Abstract
The present disclosure provides an X-ray backscattering safety inspection system, comprising: one or more backscattering inspection subsystem configured to inspect an object to be inspected by emitting X-ray beams towards the object to be inspected and inspecting scattering signals; and a control subsystem configured to adjust a distance between the backscattering inspection subsystem and locations on a side of the object to be inspected where are irradiated by the X-ray beams in real time according to a size of the object to be inspected such that the scattering signals inspected are optimized. The system may be adapted to objects to be inspected with different sizes or shapes while enhancing backscattering signals for imaging.
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