Quantitative X-ray analysis—ratio correction

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United States of America Patent

PATENT NO 9851313
SERIAL NO

14636938

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Abstract

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A method of X-ray analysis measures X-ray diffraction in transmission. In order to carry out quantitative measurements, a background measurement is taken slightly away from the diffraction peak and the ratio of measured intensities used to correct for variations in sample composition.

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Patent Owner(s)

Patent OwnerAddress
MALVERN PANALYTICAL B V7602 EA ALMELO

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Van, Den Hoogenhof Waltherus Almelo, NL 3 16
Zarkadas, Charalampos Almelo, NL 5 34

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