Rupture control device and semiconductor device to improve yield
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United States of America Patent
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Dec 26, 2017
Grant Date -
Dec 21, 2017
app pub date -
Sep 2, 2016
filing date -
Jun 15, 2016
priority date (Note) -
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Abstract
A rupture control device may include an address control circuit configured to generate a rupture address in response to a first rupture command signal, a rupture mask signal and an external address, wherein the rupture address is generated according to whether the rupture mask signal is activated, and wherein an address and fuse data are compared, and a rupture mask signal indicating whether a fuse is ruptured is determined. Further, a fuse array configured to perform a rupture operation in response to the rupture address when a rupture enable signal is activated, and output the fuse data in response to a read enable signal.
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