Analysis and purging of materials in manufacturing processes
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United States of America Patent
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Jan 9, 2018
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N/A
app pub date -
Aug 7, 2014
filing date -
Aug 7, 2014
priority date (Note) -
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Abstract
Various systems and methods of analyzing one or more properties of a sample are provided. The system includes a self-contained purging device having a sample holder and one or more analyzers for analyzing one or more properties of the sample. The purging device is configured to remove sample contained within the sample holder when an analysis is complete. In one embodiment the purging device is configured via an air pump having a tube in fluid communication with an air inlet of the sample holder, wherein the air pump is configured to deliver pressurized air to the air inlet and thereby purge the sample. The pressurized air is localized ambient air, and substantially free of contaminants. Methods and other systems are also described and illustrated.
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